Physics Room 120, Lecture Hall
The MU Physics & Astronomy Department's O. M. Stewart Colloquium Series presents Dr. Stefan Zollner, New Mexico State University, "Electrons and Phonons: Precision Measurements of Optical Constants," Monday, September 10, 4:00 p.m. in Physics Room 120, Lecture Hall.
Zollner wrotes, "Design and fabrication of electronic and optoelectronic devices require accurate knowledge of the optical constants of all materials in the device. For fabrication, thickness and properties of device layers need to be characterized. To predict performance of optical devices, we also need to know the optical constants (absorption coefficient and refractive index) of all materials. Spectroscopic ellipsometry has been the metrology method of choice in the semiconductor industry for many years, but current applications only scratch the surface of the potential capabilities of this technique. My talk will discuss how ellipsometry can investigate some basic physics questions, especially how to study electrons and phonons in semiconductors and complex metal oxides." This work was funded, in part, by the Air Force Office of Scientific Research (FA9550-13-1-0022) and by the National Science Foundation (DMR-1505172).
Refreshments will be served beginning at 3:30 p.m. in Rm. 223A, Physics Library.